
VELDHOVEN, the Netherlands, July 14, 2010 - ASML Holding NV (ASML) today announces 2010 second quarter results according to US GAAP as follows:
ASML's new YieldStar metrology solutions deliver a unique blend of precision, reliability and throughput. Offering 3-in-1 overlay, focus and CD metrology, YieldStar is available as both a standalone and an integrated tool.
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ASML's customers have seen the potential of Holistic Lithography. View more |