30+ days ago - req26297

Senior Design Engineer Yieldstar In-Device Metrology

Research & development


In a nutshell


Veldhoven, Netherlands


Research & development


3-7 years



Job Category





.We are Applications – a business line within ASML, one of the world market leaders in scanning lithography technology. We create application products that run in the most modern semiconductor fabs in the world, and we are always pushing the boundary of what is possible.
The Applications Development & Engineering department develops, integrates, and qualifies functional modules and application packages in the area of wafer metrology (critical dimension, overlay, etc.) and wafer fab applications (performance control applications). Additionally, we provide technical consulting to our customers, by designing and helping to implement integral solutions for on-product performance based on the products developed by ASML.

Job Mission

As member of a strong multidisciplinary team you enjoy developing application products used in daily customer practice. These products relate to metrology solutions to be used in R&D and in high-volume manufacturing conditions.
The job includes the whole product development process from collecting customer functional requirements, detailing the design of the product, co-develop technical and mathematical content with software engineering teams, to functional verification of the product.

You deal with various challenging topics, covering a wide variety of competences such as semiconductor processing, electronic device architecture, scatterometry, mathematical algorithms, and, ASML application products.

You will work in close collaboration with the customer, our development partners, and internal stakeholders.

You are expected to represent ASML as an expert in the field and to get recognition of this by the customers. Since you will be working intimately with customers and sensitive customer data, a high level of integrity is required for securing confidentiality, while at the same time being able to give input to product managers and system engineers for ASML product improvements.

Job Description

The job consists of following activities:

-Design, develop, evaluate and test In Device Metrology products.
-Perform data analysis with models and algorithms on customer data.
-Create functional design proposals for improving the metrology performance.
-Help implementing and executing the proposal at the customer.
-Participate actively in identifying future product features
-Traveling a few times per year to customers worldwide.

Your initial responsibilities will be adapted to your experience level. In case of little experience, adequate training will be provided for enabling your development to a higher engineer level.


Master degree or PhD in Physics, Mathematics, or Electrical Engineering, with a solid background in some of the following fields: semiconductor process technology, signal processing, knowledge of the customer fab environment, statistics, data analysis, design for experiment, semi-conductor device physics, scatterometry, machine learning and optimization


Experience with industrial research & development semiconductor processes is a pre. Proficiency in Matlab, Python or a similar language is essential.

Personal skills

-Strong analytical ability with a pragmatic attitude
-Strong customer-orientation with a drive for results
-Excellent and pro-active communicational skills
-Able to work in dynamic environment
-Creativity, self-initiative and team spirit
-Stress resistant
-Team-player with interpersonal and coaching skills

Context of the position

Within ASML, the sector Development & Engineering is responsible for the specification and the design of the ASML products. The Business Line Applications provides integrated solutions with computational, metrology and control technology for extendibility and improved efficiency of lithography products.

The holder of this position reports to the YieldStar In-Device Metrology group manager, interacts with a PO and a Scrum Master and operates within multi-disciplinary engineering SAFe teams.

Other information

Keywords: Semiconductor device processing, metrology, overlay, scatterometry (OCD), lithography, process control, data analysis, mathematics, Matlab, R&D

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