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An expert in alignment and overlay metrology
“I am a problem solver. I like to work on complex problems, particularly in a challenging environment in which you have to take into account both technical and business considerations.”
With his excellent skills in physics and mathematics, Simon Mathijssen is a well-acknowledged authority in optics, optical sensors and their applications in semiconductor fabs.
He has worked intensively on breakthrough solutions in the field of wafer alignment and overlay, in close interaction with customers using ASML’s most advanced technology.
Learn more about Simon
Applying his expertise in overlay metrology and optics, Simon and his colleagues work to align chip layers with extreme accuracy.
Get to know Simon
ASML employee since 2011
Named a Fellow in 2021
Based in Veldhoven, the Netherlands
Process robustness enhancements of alignment and overlay metrology
Alignment and overlay metrology
Holds 47 US patents across 41 ASML patent families