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Addressing complex challenges in optical systems
“I’ve done a lot of work on ILIAS – but I’ve never wanted to be seen as ‘Mr ILIAS’. Nowadays, anyone running into complex challenges with optical systems knows where to find me.”
Jan Baselmans is an optics expert. He was instrumental in the development of the ILIAS – an optical sensor, integrated in the lithography scanner, that measures lens aberrations. This sensor enables fast and accurate measurement of lens heating, which allows a control loop to correct for it.
Jan also takes part in ASML’s mentoring program, supporting the next generation of technical leaders.
Get to know Jan
ASML employee since 1994
Named a Fellow in 2012
Based in Veldhoven, the Netherlands
ILIAS wavefront sensor and the subsequent lens control
Optics, including light sources, illumination and projection systems
Holds 142 US patents across 100 ASML patent families